• DocumentCode
    2497574
  • Title

    Analog field programmable CMOS operational transresistance amplifier (OTRA)

  • Author

    Mittal, Sparsh ; Kapur, G. ; Markan, C.M. ; Pyara, V.P.

  • Author_Institution
    Fac. of Electr. Eng., Indian Inst. of Technol., Kanpur, Kanpur, India
  • fYear
    2013
  • fDate
    12-14 April 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper demonstrates a approach to design the field programmable CMOS operational transresistance amplifier. All the MOSFETs are replaced by the floating gate MOSFETs to make the OTRA design programmable. The charge at the floating gate can be programmed after fabrication, based on Hot-e-injection and Fowler-Nordheim tunneling techniques. This programming charge at floating gate results in threshold voltage variation in these MOSFETs, which in turn can modify circuit´s specifications. The high frequency small signal analysis of the design is prepared and specifications of the design are re-derived in terms of threshold voltages of the MOSFETs. The expressions of output voltage, transresistance, input impedance, output impedance and offsets are derived in terms of threshold voltages of respective MOSFETs. In order to achieve circuits AC and DC characteristics, the circuit is simulated using BSIM3 level49 MOSFET models in T-spice 0.35um CMOS process. The simulated results shows 13 bit programming precision in transresistance, input impedance, output impedance, Temperature stability and dc offsets with respect to threshold voltage of respective MOSFETs.
  • Keywords
    CMOS analogue integrated circuits; MOSFET; operational amplifiers; semiconductor device models; AC characteristic; BSIM3 level49 MOSFET model; DC characteristic; DC offset; Fowler-Nordheim tunneling technique; Hot-e-injection; OTRA; T-spice; analog field programmable CMOS; floating gate MOSFET; input impedance; operational transresistance amplifier; output impedance; output voltage; size 0.35 micron; temperature stability; threshold voltage variation; Impedance; MOSFET; Nonvolatile memory; Programming; Sensitivity; Threshold voltage; Floating Gate MOSFETs; High Frequency Small Signal Analysis; Operational Transresistance Amplifier; Specification; Threshold Voltages;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering and Systems (SCES), 2013 Students Conference on
  • Conference_Location
    Allahabad
  • Print_ISBN
    978-1-4673-5628-2
  • Type

    conf

  • DOI
    10.1109/SCES.2013.6547502
  • Filename
    6547502