Title :
Minimizing calibration time using inter-subject information of single-trial recognition of error potentials in brain-computer interfaces
Author :
Iturrate, Iñaki ; Montesano, Luis ; Chavarriaga, Ricardo ; Millán, José Del R ; Minguez, Javier
Author_Institution :
Dipt. de Inf. e Ing. de Sist. (DIIS), Univ. de Zaragoza, Zaragoza, Spain
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
One of the main problems of both synchronous and asynchronous EEG-based BCIs is the need of an initial calibration phase before the system can be used. This phase is necessary due to the high non-stationarity of the EEG, since it changes between sessions and users. The calibration process limits the BCI systems to scenarios where the outputs are very controlled, and makes these systems non-friendly and exhausting for the users. Although it has been studied how to reduce calibration time for asynchronous signals, it is still an open issue for event-related potentials. Here, we propose the minimization of the calibration time on single-trial error potentials by using classifiers based on inter-subject information. The results show that it is possible to have a classifier with a high performance from the beginning of the experiment, and which is able to adapt itself making the calibration phase shorter and transparent to the user.
Keywords :
bioelectric potentials; brain-computer interfaces; calibration; electroencephalography; asynchronous EEG; brain computer interfaces; calibration time; error potential; event related potential; intersubject information; single trial recognition; Accuracy; Brain computer interfaces; Calibration; Electrodes; Electroencephalography; Training; Vectors; Adult; Algorithms; Brain; Calibration; Electrodes; Electroencephalography; Equipment Design; Evoked Potentials; Female; Humans; Male; Man-Machine Systems; Neurophysiology; Pattern Recognition, Automated; Reproducibility of Results; Time Factors; User-Computer Interface;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091572