• DocumentCode
    2497760
  • Title

    Production Statistics of SC (or TTC) Crystals

  • Author

    Kusters, John A. ; Adams, Charles A.

  • fYear
    1980
  • fDate
    1980
  • Firstpage
    167
  • Lastpage
    174
  • Keywords
    Automatic testing; Circuit testing; Crystals; Electrical resistance measurement; Frequency; Oscillators; Production; Statistics; System testing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    34th Annual Symposium on Frequency Control. 1980
  • Type

    conf

  • DOI
    10.1109/FREQ.1980.200398
  • Filename
    1537338
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2497760