2497783

Microsystem Testing: Challenge Or Common Knowledge

Kerkhoff, H.G.

1998

2-4 Dec 1998

510

511

Actuators; Circuit testing; Digital circuits; Electrical equipment industry; Electronics industry; Industrial electronics; Integrated circuit interconnections; Integrated circuit testing; Large-scale systems; Logic testing; Silicon; Telematics;

English

ieee

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

1081-7735

0-8186-8277-9

conf

10.1109/ATS.1998.741665

741665