DocumentCode
2497783
Title
Microsystem Testing: Challenge Or Common Knowledge
Author
Kerkhoff, H.G.
fYear
1998
fDate
2-4 Dec 1998
Firstpage
510
Lastpage
511
Keywords
Actuators; Circuit testing; Digital circuits; Electrical equipment industry; Electronics industry; Industrial electronics; Integrated circuit interconnections; Integrated circuit testing; Large-scale systems; Logic testing; Silicon; Telematics;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN
1081-7735
Print_ISBN
0-8186-8277-9
Type
conf
DOI
10.1109/ATS.1998.741665
Filename
741665
Link To Document