DocumentCode :
2497848
Title :
Testing Embedded Memories: Is BIST The Ultimate Solution?
Author :
Wu, Cheng-Wen
fYear :
1998
fDate :
2-4 Dec 1998
Firstpage :
516
Lastpage :
517
Keywords :
Application specific integrated circuits; Automatic testing; Built-in self-test; Flash memory; Logic devices; Logic testing; Random access memory; Redundancy; Semiconductor device noise; Semiconductor memory; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
ISSN :
1081-7735
Print_ISBN :
0-8186-8277-9
Type :
conf
DOI :
10.1109/ATS.1998.741668
Filename :
741668
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2497848
