Title :
Optical and structural properties of GaInP/InP quantum wells with strained barriers
Author :
Bensaada, A. ; Brebner, J.L. ; Chennouf, A. ; Cochrane, R.W. ; Graham, J.T. ; Leonelli, R. ; Masut, R.A.
Author_Institution :
Montreal Univ., Que., Canada
Abstract :
The authors report on semiconductor quantum well structures in which the well material is unstrained while the barrier region is under tension. They present optical and structural properties of such a configuration, namely, GaxIn1-xP/InP multiple quantum wells (MQWs) onto heavily S-doped InP (001) substrates. Low temperature optical absorption spectra show several well-defined peaks between 1.42 and 1.46 eV. Peaks at several of the same energies are observed in the photoluminescence spectra. A Kronig-Penney model, modified to include strain effects, has been constructed to interpret these spectra using layer thicknesses and strains determined directly by high-resolution X-ray diffraction as input to the model. Good agreement is found between the observed peaks and calculated transitions in the well, barrier and buffer layers. The temperature dependence of the peak positions follows that of the InP bandgap, as expected from this model. A strong enhancement of the absorption coefficient of the barriers is observed as compared to the bulk material
Keywords :
III-V semiconductors; Kronig-Penney model; X-ray diffraction; energy gap; excitons; gallium compounds; heavily doped semiconductors; indium compounds; photoluminescence; semiconductor quantum wells; sulphur; visible spectra; GaInP-InP:S; GaInP/InP quantum wells; InP bandgap; Kronig-Penney model; absorption coefficient; barrier region; heavily S-doped InP (001) substrates; high-resolution X-ray diffraction; layer thicknesses; photoluminescence spectra; semiconductor; strain effects; strained barriers; structural properties; temperature dependence; Capacitive sensors; Electromagnetic wave absorption; Indium phosphide; Optical buffering; Optical materials; Photoluminescence; Quantum well devices; Semiconductor materials; Substrates; Temperature;
Conference_Titel :
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location :
Paris
Print_ISBN :
0-7803-0993-6
DOI :
10.1109/ICIPRM.1993.380579