Title :
Testing Embedded Memories: Is Bist The Ultimate Solution? An Asic Designer´s Point Of View
Keywords :
Application specific integrated circuits; Built-in self-test; Circuit faults; Circuit testing; Design engineering; Logic testing; Random access memory; Read only memory; Read-write memory; System-on-a-chip;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741669
