• DocumentCode
    2497867
  • Title

    Analysis of a multistage interconnection network using binary decision diagrams (BDD)

  • Author

    Chiu, Jian ; Dugan, Joanne Bechta

  • Author_Institution
    Nat. Semicond. Corp., Arlington, TX, USA
  • fYear
    1996
  • fDate
    23-25 Oct 1996
  • Firstpage
    34
  • Lastpage
    43
  • Abstract
    The authors use the BDD to help derive a closed-form solution for the reliability of a multistage interconnection network with n stages. The BDD reveals repeated structures, the reliability of which can be encoded in a recursive formula. An exact solution of a network with an arbitrary number of stages can be computed in time proportional to the number of stages. They also provide results which include the concept of imperfect coverage, in which two mutually-exclusive failure modes (with different effects) are possible for certain switching elements
  • Keywords
    Boolean functions; computational complexity; diagrams; fault tolerant computing; multistage interconnection networks; reliability; binary decision diagrams; closed-form solution; computation time; exact solution; imperfect coverage; multistage interconnection network analysis; mutually-exclusive failure modes; recursive formula; reliability; repeated structures; switching elements; Binary decision diagrams; Boolean functions; Closed-form solution; Communication switching; Data structures; Fault tolerance; Multiprocessor interconnection networks; Postal services; Semiconductor device reliability; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliable Distributed Systems, 1996. Proceedings., 15th Symposium on
  • Conference_Location
    Nigara-on-the-Lake, Ont.
  • ISSN
    1060-9857
  • Print_ISBN
    0-8186-7481-4
  • Type

    conf

  • DOI
    10.1109/RELDIS.1996.559693
  • Filename
    559693