DocumentCode
2497867
Title
Analysis of a multistage interconnection network using binary decision diagrams (BDD)
Author
Chiu, Jian ; Dugan, Joanne Bechta
Author_Institution
Nat. Semicond. Corp., Arlington, TX, USA
fYear
1996
fDate
23-25 Oct 1996
Firstpage
34
Lastpage
43
Abstract
The authors use the BDD to help derive a closed-form solution for the reliability of a multistage interconnection network with n stages. The BDD reveals repeated structures, the reliability of which can be encoded in a recursive formula. An exact solution of a network with an arbitrary number of stages can be computed in time proportional to the number of stages. They also provide results which include the concept of imperfect coverage, in which two mutually-exclusive failure modes (with different effects) are possible for certain switching elements
Keywords
Boolean functions; computational complexity; diagrams; fault tolerant computing; multistage interconnection networks; reliability; binary decision diagrams; closed-form solution; computation time; exact solution; imperfect coverage; multistage interconnection network analysis; mutually-exclusive failure modes; recursive formula; reliability; repeated structures; switching elements; Binary decision diagrams; Boolean functions; Closed-form solution; Communication switching; Data structures; Fault tolerance; Multiprocessor interconnection networks; Postal services; Semiconductor device reliability; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliable Distributed Systems, 1996. Proceedings., 15th Symposium on
Conference_Location
Nigara-on-the-Lake, Ont.
ISSN
1060-9857
Print_ISBN
0-8186-7481-4
Type
conf
DOI
10.1109/RELDIS.1996.559693
Filename
559693
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