DocumentCode

2497895

Title

Testing Embedded Memories: Is Bist The Ultimate Solution? Testing Of Embedded Memories-the Aggregate

Author

Makki, R.Z.

fYear

1998

fDate

2-4 Dec 1998

Firstpage

519

Lastpage

519

Keywords

Aggregates; Built-in self-test; Current supplies; Logic testing; Manufacturing; Power supplies;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

ISSN

1081-7735

Print_ISBN

0-8186-8277-9

Type

conf

DOI

10.1109/ATS.1998.741670

Filename

741670