Title :
Testing Embedded Memories: Is Bist The Ultimate Solution? Testing Of Embedded Memories-the Aggregate
Keywords :
Aggregates; Built-in self-test; Current supplies; Logic testing; Manufacturing; Power supplies;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741670
