Title :
High Speed, High Bandwidth On-Chip Current and Voltage Sensor
Author :
Kruppa, J. ; Hesidenz, D.
Author_Institution :
Friedrich-Alexander-Univ. Erlangen-Nurnberg, Munich
Abstract :
A high speed and high bandwidth on-chip sampling sensor system has been developed and realized in a standard 130 nm single-well CMOS process to measure dynamic switching currents flowing into chip sub-modules and the resulting voltage drops on power supply lines. A test chip with the primary function to compare different on-chip decoupling techniques has been equipped with the sensor and manufactured. The sensor achieved time resolution of 2 ps corresponding to 500 GHz sampling rate and a 10 bit voltage resolution. The waveforms measured with our on-chip sensor match well with the simulation results and could not be obtained by off-chip measurements. Besides power supply noise, crosstalk effects on signal and supply lines can be measured by the system without affection of measured signals coming from high impedance sources.
Keywords :
CMOS integrated circuits; electric potential; electric sensing devices; power supply circuits; chip sub-modules; current sensor; high bandwidth sensor; high speed sensor; on-chip sampling sensor; power supply lines; single-well CMOS process; size 130 nm; voltage drops; voltage resolution; voltage sensor; word length 10 bit; Bandwidth; Crosstalk; Impedance measurement; Noise measurement; Power measurement; Power supplies; Sampling methods; Semiconductor device measurement; Signal resolution; Voltage;
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.355877