DocumentCode
2498196
Title
High Speed, High Bandwidth On-Chip Current and Voltage Sensor
Author
Kruppa, J. ; Hesidenz, D.
Author_Institution
Friedrich-Alexander-Univ. Erlangen-Nurnberg, Munich
fYear
2006
fDate
22-25 Oct. 2006
Firstpage
1337
Lastpage
1340
Abstract
A high speed and high bandwidth on-chip sampling sensor system has been developed and realized in a standard 130 nm single-well CMOS process to measure dynamic switching currents flowing into chip sub-modules and the resulting voltage drops on power supply lines. A test chip with the primary function to compare different on-chip decoupling techniques has been equipped with the sensor and manufactured. The sensor achieved time resolution of 2 ps corresponding to 500 GHz sampling rate and a 10 bit voltage resolution. The waveforms measured with our on-chip sensor match well with the simulation results and could not be obtained by off-chip measurements. Besides power supply noise, crosstalk effects on signal and supply lines can be measured by the system without affection of measured signals coming from high impedance sources.
Keywords
CMOS integrated circuits; electric potential; electric sensing devices; power supply circuits; chip sub-modules; current sensor; high bandwidth sensor; high speed sensor; on-chip sampling sensor; power supply lines; single-well CMOS process; size 130 nm; voltage drops; voltage resolution; voltage sensor; word length 10 bit; Bandwidth; Crosstalk; Impedance measurement; Noise measurement; Power measurement; Power supplies; Sampling methods; Semiconductor device measurement; Signal resolution; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2006. 5th IEEE Conference on
Conference_Location
Daegu
ISSN
1930-0395
Print_ISBN
1-4244-0375-8
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2007.355877
Filename
4178872
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