• DocumentCode
    2498521
  • Title

    Particle swarm optimization-based feature selection for cognitive state detection

  • Author

    Firpi, H. Alexer ; Vogelstein, R. Jacob

  • Author_Institution
    Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    6556
  • Lastpage
    6559
  • Abstract
    This manuscript proposes a particle swarm-based feature extraction to monitors brain activity with the goal of identifying correlate cognitive states and intensity of a task. This in turn would allow us to develop a pattern recognition system that will classify such cognitive states and thus to redistribute the workload to other subjects. In this abstract, we present a recognition system that employ multiple features from different domains, a feature selection method using a Particle Swarm Optimization (PSO) search algorithm while the classification is provided using a k-nearest neighbor. Through this approach, we are able to achieve an averaged classification accuracy of 90.25% on held-out, cross-validated data among the eight subjects.
  • Keywords
    cognition; electroencephalography; feature extraction; medical signal processing; particle swarm optimisation; signal classification; EEG; brain activity monitoring; cognitive state detection; feature extraction; feature selection; k-nearest neighbor; particle swarm optimization; pattern recognition system; signal classification; Accuracy; Electroencephalography; Entropy; Feature extraction; Sensitivity; Testing; Training; Algorithms; Area Under Curve; Artificial Intelligence; Brain; Cognition; Electroencephalography; Humans; Man-Machine Systems; Military Personnel; Models, Statistical; Models, Theoretical; Pattern Recognition, Automated; ROC Curve; Reproducibility of Results; Signal Processing, Computer-Assisted; United States; User-Computer Interface;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6091617
  • Filename
    6091617