DocumentCode
2498547
Title
Measurement Of New Millimeterwave Devices And Components Using Picosecond Techniques
Author
Fetterman, H.R. ; Martin, M. ; Oshita, F. ; Plant, D.V. ; Kain, A.Z.
Author_Institution
University of California
fYear
1993
fDate
19-21 July 1993
Firstpage
61
Lastpage
62
Keywords
Autocorrelation; Frequency; Heterojunction bipolar transistors; Optical control; Optical polymers; Optical resonators; Optical switches; Semiconductor devices; Temperature; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packaging/Gigabit Networks., LEOS 1993 Summer Topi
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-1284-8
Type
conf
DOI
10.1109/LEOSST.1993.696809
Filename
696809
Link To Document