DocumentCode :
2498547
Title :
Measurement Of New Millimeterwave Devices And Components Using Picosecond Techniques
Author :
Fetterman, H.R. ; Martin, M. ; Oshita, F. ; Plant, D.V. ; Kain, A.Z.
Author_Institution :
University of California
fYear :
1993
fDate :
19-21 July 1993
Firstpage :
61
Lastpage :
62
Keywords :
Autocorrelation; Frequency; Heterojunction bipolar transistors; Optical control; Optical polymers; Optical resonators; Optical switches; Semiconductor devices; Temperature; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packaging/Gigabit Networks., LEOS 1993 Summer Topi
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-1284-8
Type :
conf
DOI :
10.1109/LEOSST.1993.696809
Filename :
696809
Link To Document :
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