• DocumentCode
    2498571
  • Title

    Photoluminescence excitation spectra from undoped InP

  • Author

    Yoshinaga, H. ; Makita, Y. ; Yamada, A. ; Tsai, Y. ; Iida, T. ; Shibata, Hajime ; Obara, A. ; Matsumori, T. ; Uekusa, S. ; Kaino, K. ; Oda, O.

  • Author_Institution
    Tokai Univ., Hiratsuka, Kanagawa, Japan
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    630
  • Lastpage
    633
  • Abstract
    In extremely pure InP when samples are annealed, five sharp emissions labeled by Xi (i = 1-4) and W were observed slightly below bound exciton emissions. Selectively-excited photoluminescence and photoluminescence excitation measurements were made to examine the features of these five emissions in the spectrum of annealed undoped InP. Four sharp emissions were observed below bound exciton emissions in undoped InP when samples were annealed at above 350°C. Through low temperature photoluminescence excitation (PLE) spectroscopy, it was confirmed that these emissions are closely related with donor impurities. An additional sharp emission observed below the well-established donor-acceptor emission, denoted by W was also determined for the first time to be associated with the acceptor. It was concluded that PLE spectroscopy is a very powerful method to identify the origins of radiative transitions
  • Keywords
    III-V semiconductors; annealing; excitons; impurity states; indium compounds; photoluminescence; 350 degC; InP; PLE spectroscopy; annealed undoped InP; bound exciton emissions; donor impurities; donor-acceptor emission; low temperature photoluminescence excitation; photoluminescence excitation measurements; radiative transitions; sharp emission; undoped InP; Annealing; Excitons; Gallium arsenide; Impurities; Indium phosphide; Laser excitation; Photoluminescence; Plasma measurements; Wavelength measurement; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-0993-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1993.380616
  • Filename
    380616