• DocumentCode
    2498611
  • Title

    EEG/MEG source localization using source deflated matching pursuit

  • Author

    Wu, Shun Chi ; Swindlehurst, A. Lee

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Irvine, Irvine, CA, USA
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 3 2011
  • Firstpage
    6572
  • Lastpage
    6575
  • Abstract
    A matching pursuit (MP) based algorithm, called source deflated matching pursuit (SDMP), is proposed for locating sources of brain activity. By iteratively deflating the contribution of identified sources to multiple measurement vectors (MMVs), the SDMP algorithm transforms the original multi-basis-vector/matrix selection problem into a single-basis-vector/matrix selection problem, which not only mitigates the residual-source interference but also remedies the intrinsic bias when locating deep sources. The robustness of the proposed algorithm to two bias factors is verified through simulations.
  • Keywords
    electroencephalography; iterative methods; magnetoencephalography; matrix algebra; medical signal processing; source separation; time-frequency analysis; EEG source localization; MEG source localization; MMV; SDMP algorithm; brain activity source localisation; iterative method; matching pursuit based algorithm; multibasis matrix selection problem; multibasis vector selection problem; multiple measurement vectors; residual-source interference; single basis matrix selection problem; single basis vector selection problem; source deflated matching pursuit; Brain modeling; Electroencephalography; Interference; Matching pursuit algorithms; Signal processing algorithms; Vectors; Algorithms; Brain; Computer Simulation; Computers; Electroencephalography; Humans; Magnetoencephalography; Models, Statistical; Models, Theoretical; Signal Processing, Computer-Assisted; Software;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
  • Conference_Location
    Boston, MA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4121-1
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2011.6091621
  • Filename
    6091621