• DocumentCode
    2498903
  • Title

    Electromagnetic fields near high voltage electrical power lines: a parametric analysis

  • Author

    Liu, J. ; Ruan, W. ; Fortin, S. ; Dawalibi, F.P.

  • Author_Institution
    Safe Eng. Services & Technol. Ltd., Montreal, Que., Canada
  • Volume
    1
  • fYear
    2002
  • fDate
    13-17 Oct 2002
  • Firstpage
    401
  • Abstract
    The electromagnetic (EM) fields near high voltage electrical power lines are computed and analyzed using an electromagnetic field theory approach. A parametric analysis of the effects of several key variables on the electromagnetic fields is carried out. The variables include: the cross-sectional configuration of the transmission lines (T/L) and distribution lines (D/L), the voltage level of the line, the load current and the effects of unbalance, the type of static wire, the soil resistivity, and the shielding effects of nearby metallic structures such as buildings, fences and pipelines. The computation results of an extensive set of studies are summarized. They provide a means to estimate the electromagnetic fields generated by a nearby high voltage transmission or distribution line before a detailed study is performed.
  • Keywords
    electromagnetic field theory; electromagnetic shielding; power distribution lines; power overhead lines; 230 kV; 345 kV; 500 kV; 735 kV; EM fields estimation; buildings; cross-sectional configuration; distribution lines; electromagnetic field theory; electromagnetic fields; fences; high voltage electrical power lines; load current; metallic structures; parametric analysis; pipelines; shielding effects; soil resistivity; static wire; transmission lines; unbalance effects; voltage level; Buildings; Conductivity; Electromagnetic analysis; Electromagnetic field theory; Electromagnetic fields; Power transmission lines; Soil; Transmission line theory; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power System Technology, 2002. Proceedings. PowerCon 2002. International Conference on
  • Print_ISBN
    0-7803-7459-2
  • Type

    conf

  • DOI
    10.1109/ICPST.2002.1053575
  • Filename
    1053575