DocumentCode
2499229
Title
An on-chip testbed that emulates runtime traffic and reduces design verification time for FPGA designs
Author
Chen, Wayne ; Shannon, Lesley
Author_Institution
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC
fYear
2008
fDate
8-10 Dec. 2008
Firstpage
361
Lastpage
364
Abstract
Field programmable gate arrays (FPGAs) are commonly used as an inexpensive and flexible implementation platform for system-on-chip (SoC) designs. Now that FPGAs are large enough to implement SoCs, the reprogrammable fabric allows a different approach to the design process where on-chip computer aided design (CAD) tools can leverage reconfigurability to reduce design time. Statistics on commercial SoC designs suggest that 50% or more of design time may be spent on testing and verification due to design complexity. In previous work, we have proposed the systems integrating modules with predefined physical links (SIMPPL) SoC architectural framework to improve the design process. The defined communication links and protocols have been used to reduce integration time by an order of magnitude. In this paper, we propose an on-chip testbed that leverages both SIMPPL and an FPGApsilas reconfigurability to enable onchip testing and verification in real time using run time traffic patterns to reduce design time. The proposed testbed requires 331 LUTs and 224 flipflops for the Transmitter and 31 LUTs and 30 flipflops for the receiver. This testbed is able to generate a variety of possible run time traffic patterns that may be used to verify the operation of the CE.
Keywords
circuit CAD; field programmable gate arrays; statistical analysis; system-on-chip; CAD tools; FPGA designs; SoC; computer aided design; design complexity; design verification time reduction; field programmable gate arrays; flipflops; onchip testbed; onchip testing; runtime traffic; system-on-chip; systems integrating modules with predefined physical links; Design automation; Fabrics; Field programmable gate arrays; Process design; Protocols; Runtime; Statistical analysis; System-on-a-chip; Table lookup; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ICECE Technology, 2008. FPT 2008. International Conference on
Conference_Location
Taipei
Print_ISBN
978-1-4244-3783-2
Electronic_ISBN
978-1-4244-2796-3
Type
conf
DOI
10.1109/FPT.2008.4762418
Filename
4762418
Link To Document