DocumentCode :
2499300
Title :
Interphase gap decreases electrical stimulation threshold of retinal ganglion cells
Author :
Weitz, A.C. ; Behrend, M.R. ; Humayun, M.S. ; Chow, R.H. ; Weiland, J.D.
Author_Institution :
Biomed. Eng. Dept., Univ. of Southern California, Los Angeles, CA, USA
fYear :
2011
fDate :
Aug. 30 2011-Sept. 3 2011
Firstpage :
6725
Lastpage :
6728
Abstract :
The most common electrical stimulation pulse used in retinal implants is a symmetric biphasic current pulse. Prior electrophysiological studies in peripheral nerve have shown that adding an interphase gap (IPG) between the two phases makes stimulation more efficient. We investigated the effect of IPG duration on retinal ganglion cell (RGC) electrical threshold. We used calcium imaging to measure the activity of RGCs in isolated retina in response to electrical stimulation. By varying IPG duration, we were able to examine the effect of duration on threshold. We further studied this effect by simulating RGC behavior with a Hodgkin-Huxley-type model. Our results indicate that the threshold for electrical activation of RGCs can be reduced by increasing the length of the IPG.
Keywords :
bioelectric phenomena; biomedical optical imaging; calcium; cellular biophysics; eye; neurophysiology; physiological models; prosthetics; Hodgkin-Huxley model; calcium imaging; electrical stimulation pulse; electrical stimulation threshold; electrophysiology; interphase gap; peripheral nerve; retinal ganglion cells; retinal implants; symmetric biphasic current pulse; Animals; Calcium; Computational modeling; Electric potential; Mathematical model; Prosthetics; Retina; Ambystoma; Animals; Axons; Calcium; Computer Simulation; Electric Stimulation; Electrodes; Electrophysiology; Humans; Microelectrodes; Microscopy, Fluorescence; Models, Animal; Reproducibility of Results; Retina; Retinal Ganglion Cells; Retinitis Pigmentosa;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2011.6091658
Filename :
6091658
Link To Document :
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