DocumentCode :
2499341
Title :
Control of structure and properties of compound semiconductor interfaces by Si interface control layer
Author :
Hasegawa, H. ; Kodama, S. ; Koyanagi, K. ; Akazawa, M.
Author_Institution :
Dept. of Electr. Eng., Hokkaido Univ., Sapporo, Japan
fYear :
1993
fDate :
19-22 Apr 1993
Firstpage :
289
Lastpage :
292
Abstract :
The authors review the current status of recent attempts to control the structure and properties of compound semiconductor interfaces by an ultrathin Si interface control layer. Surface and interface states in the energy gap cause many unwanted effects including the so-called Fermi level pinning phenomenon, which is discussed. Control of insulator-semiconductor, metal-semiconductor, and semiconductor-semiconductor interfaces are considered
Keywords :
Fermi level; elemental semiconductors; energy gap; interface states; interface structure; semiconductor heterojunctions; semiconductor-insulator boundaries; semiconductor-metal boundaries; silicon; Fermi level pinning; Si interface control layer; compound semiconductor interfaces; energy gap; properties; structure; Fabrication; Gallium arsenide; Indium gallium arsenide; Insulation; Interface states; Oxidation; Passivation; Semiconductor nanostructures; Signal processing; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location :
Paris
Print_ISBN :
0-7803-0993-6
Type :
conf
DOI :
10.1109/ICIPRM.1993.380653
Filename :
380653
Link To Document :
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