Title :
Microcontroller modulation for VLF high voltage generator rate 3 kV peak using DSPIC-30F2010
Author :
Seesanga, S. ; Kongnun, W. ; Chotigo, S.
Author_Institution :
Dept. of Electr. Eng., King Mongkut´´s Univ. of Technol. Thonburi, Bangkok
Abstract :
This paper describes a microcontroller modulation at 0.1 Hz for very low frequency (VLF) high voltage generator. This is used for testing field aged cable. This paper shows a simple type of the modulation circuit for VLF high voltage generator by microcontroller modulation with a sinusoidal signal at frequency 0.1 Hz and carrier signal at frequency 10 kHz. The unipolar pulse with modulation (PWM) technique is employed to control a single-phase inverter that produces a sinusoidal VLF high voltage of desired magnitude and frequency. This microcontroller modulation will be used to construct a sinusoidal VLF high voltage for non-destructive testing insulation of the crosslinked polyethylene (XLPE) cable. The digital signal controller (DSPIC-30F2010) is implemented to the inverter. In this paper show example to used microcontroller (DSPIC-30F2010) with VLF high voltage generator rate voltage output 3 kV peak.
Keywords :
PWM invertors; XLPE insulation; digital signal processing chips; electric generators; high-voltage techniques; insulation testing; life testing; microcontrollers; nondestructive testing; power cable insulation; power cable testing; DSPIC-30F2010; VLF high voltage generator; XLPE cable; aged cable testing; crosslinked polyethylene cable; digital signal controller; frequency 0.1 Hz; frequency 10 kHz; microcontroller modulation; non-destructive testing insulation; single-phase inverter control; unipolar pulse with modulation technique; very low frequency generator; voltage 3 kV; Aging; Circuit testing; Frequency modulation; Insulation testing; Microcontrollers; Nondestructive testing; Pulse inverters; Pulse width modulation inverters; Signal generators; Voltage control; unipolar modulation technique; very low frequency;
Conference_Titel :
Power and Energy Conference, 2008. PECon 2008. IEEE 2nd International
Conference_Location :
Johor Bahru
Print_ISBN :
978-1-4244-2404-7
Electronic_ISBN :
978-1-4244-2405-4
DOI :
10.1109/PECON.2008.4762436