• DocumentCode
    2499514
  • Title

    PFM investigation of stress induced ferroelastic switching in piezoelectric bulk ceramics

  • Author

    Mtebwa, Mahamudu ; Colla, Enrico ; Sluka, Tomas ; Damjanovic, Dragan ; Setter, Nava ; Gjødvad, Lars

  • Author_Institution
    Ceramics Lab., EPFL, Lausanne, Switzerland
  • fYear
    2010
  • fDate
    9-12 Aug. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Stress induced ferroelastic switching may represent an efficient toughening mechanism in piezoelectric-ferroelectric ceramics. During the crack propagation, the high tensional stresses at the crack tip can be partially released by the reorientation of 90 degree domains from along to perpendicular to the propagation direction. Compared to the phase transformation approach (inclusion of zirconia particles in the metastable tetragonal phase) this mechanism is not expected to reduce the piezoelectric properties of the material. In this work, we first present a method, which enables controlled crack growth in piezoelectric ceramics on a PFM instrument in order to observe the exact evolution of the ferroelastic domains and then preliminary observations of the ferroelectric domain patterns around a crack tip obtained by indentation are discussed. The observed domain structure in the vicinity of the crack tip shows similarity with the domain patters reported in other works, which include modeling and XRD.
  • Keywords
    X-ray diffraction; cracks; electric domains; ferroelasticity; ferroelectric ceramics; ferroelectric switching; lead compounds; piezoceramics; PFM; PZT; XRD; crack growth; crack propagation; domain structure; ferroelastic domains; ferroelectric domain patterns; piezoelectric bulk ceramics; piezoelectric-ferroelectric ceramics; stress induced ferroelastic switching; tensional stresses; toughening mechanism; Actuators; Ceramics; Electrodes; Strain; Stress; Switches; Ferroelasticity; PFM; PZT; Toughening;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics (ISAF), 2010 IEEE International Symposium on the
  • Conference_Location
    Edinburgh
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-8190-3
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2010.5712232
  • Filename
    5712232