Piezoresponse Force Microscopy study of a single-crystal LiTaO3 thin film obtained by the Smart Cut™ technology

Author

Brugere, A. ; Moulet, J.S. ; Gidon, S. ; Tchelnokov, A. ; Deguet, C. ; Clavelier, L. ; Ghyselen, B. ; Gautier, B.

Author_Institution

CEA-Leti-Minatec, Grenoble, France

fYear

2010

fDate

9-12 Aug. 2010

Firstpage

1

Lastpage

4

Abstract

The dynamics of domains stability of a 120-nm-thick Z-cut single-crystal LiTaO₃ thin film obtained through the Smart Cut™ technology is investigated using Piezoresponse Force Microscopy. The artificially created -Z domains were found to completely relax, driven by the large built-in field observed in the structure. A constant domain wall velocity of 0.2-0.6 nm/s was extracted from the evolution of the equivalent radius of the different domains observed.

Keywords

crystal growth from melt; electric domain walls; ferroelectric thin films; lithium compounds; piezoelectricity; Czochralzki method; LiTaO₃; Z domains; domain stability; domain wall velocity; ferroelectric materials; piezoresponse force microscopy; single-crystal thin film; smart cut technology; Electrodes; Films; Force; Hysteresis; Microscopy; Piezoelectric polarization; Voltage measurement; LiTaO3 thin film; Piezoresponse Force Microscopy; Smart Cut™; domain stability;

fLanguage

English

Publisher

ieee

Conference_Titel

Applications of Ferroelectrics (ISAF), 2010 IEEE International Symposium on the

Conference_Location

Edinburgh

ISSN

1099-4734

Print_ISBN

978-1-4244-8190-3

Electronic_ISBN

1099-4734

Type

conf

DOI

10.1109/ISAF.2010.5712239

Filename

5712239