Title :
Digital Temperature Compensation of Crystal Oscillators
Author :
Renard, A.M. ; Barnhill, K.
Keywords :
Automatic testing; Costs; Equations; Frequency; Interpolation; Oscillators; Ovens; System testing; Temperature; Voltage;
Conference_Titel :
Thirty Fifth Annual Frequency Control Symposium. 1981
DOI :
10.1109/FREQ.1981.200511
