DocumentCode :
2499997
Title :
Electromechanical properties of PMN-PT and PZT ceramics at cryogenic temperatures
Author :
Thiercelin, Mickael ; Dammak, Hichem ; Thi, Mai Pham
Author_Institution :
Proprietes et Modelisation des, Solides (SPMS), Ecole Centrale Paris, Chatenay-Malabry, France
fYear :
2010
fDate :
9-12 Aug. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Space borne observation requires extremely high resolution systems with large dimensions. The design of such systems implies associating sensing and actuation systems to insure a highly stable positioning of optical components. However, the currently used PZT materials for piezoelectric actuation show strongly diminished strain at cryogenic temperatures. This work explores the performances of PMN-xPT piezoelectric materials at cryogenic temperatures. Temperature dependence of PMN-xPT ceramics is compared with hard PZT (PZT-4) and soft PZT (PZT5H) ceramics from RT to 10 K. PMN-PT tetragonal compositions exhibit stable piezoelectric constant in the 250-100 K range. The highest values of piezoelectric constant are observed for PMN-38PT in the 200-50 K range. All ceramics exhibit decreasing performances versus cooling temperature. This behaviour is attributed to a “freezing out” of extrinsic contributions to piezoelectricity but is also due to a contribution of quantum effects. The mechanical quality factor (Qm) increases very quickly from 50 K to 10 K for all samples. This fact could be due to low relaxation processes at very low temperatures.
Keywords :
cryogenics; dielectric relaxation; lead compounds; piezoceramics; piezoelectricity; PMN-PbTiO3; PZT; cooling temperature; cryogenic temperature; electromechanical properties; mechanical quality factor; piezoelectric constant; piezoelectric materials; quantum effects; relaxation; temperature 200 K to 50 K; tetragonal compositions; Ceramics; Cryogenics; Dielectric constant; Dielectric losses; Temperature; Temperature dependence; PMN-PT; PZT; ceramic; cryogenic temperatures; piezoelectric;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics (ISAF), 2010 IEEE International Symposium on the
Conference_Location :
Edinburgh
ISSN :
1099-4734
Print_ISBN :
978-1-4244-8190-3
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2010.5712258
Filename :
5712258
Link To Document :
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