• DocumentCode
    25
  • Title

    HTS Coil Test Facility in a Large Bore 20 T Resistive Magnet at LNCMI

  • Author

    Miyoshi, Yasuyuki ; Chaud, X. ; Debray, Francois ; Vincent, B. ; Tixador, P. ; Lecrevisse, Thibault ; Rey, Jean-Michel ; Oguro, H. ; Awaji, S. ; Watanabe, K. ; Nishijima, Gen ; Kitaguchi, Hitoshi

  • Author_Institution
    LNCMI, UPS, Grenoble, France
  • Volume
    23
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    9500204
  • Lastpage
    9500204
  • Abstract
    The high temperature superconductor (HTS) coil development, especially in the interest of high field insert coil, requires characterizations of a prototype coil in high magnetic field. Our test probe fits into the bore of Ø 170 mm 20 T dc magnet, and the sample space Ø 130 mm allows test coils with ~Ø 110 mm and 140 mm height. A fast data acquisition method at sampling period of 0.1 ms was developed for coil quench test program, and a working principle of the method is demonstrated for a small test coil. To accommodate high current required in tests such as Ic and hoop stress tests, the new current leads were manufactured with an optimal current measured in the range of 600 ~ 700 A, which was sufficient for the envisaged coil tests. For short duration, the current lead could carry more than 1000 A without any influence of overheating in short sample Ic test. A demonstration of short sample Ic test is also presented.
  • Keywords
    data acquisition; high-temperature superconductors; prototypes; superconducting coils; HTS coil test facility; LNCMI; coil quench test program; data acquisition; high field insert coil; high temperature superconductor coil; hoop stress test; magnetic flux density 20 T; prototype coil; resistive magnet; Coils; Heating; High temperature superconductors; Integrated circuits; Superconducting magnets; Temperature measurement; Voltage measurement; Critical current; HTS; current lead;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2012.2234317
  • Filename
    6403524