• DocumentCode
    2500186
  • Title

    Atomic layer epitaxy of InP and InAs/InP heterostructures

  • Author

    Tran, C.A. ; Masu, R.A. ; Brebner, J.L. ; Jouanne, M. ; Leonelli, R.

  • Author_Institution
    Dept. de Phys., Montrel Univ., Que., Canada
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    111
  • Lastpage
    114
  • Abstract
    The samples used for this study were InAs/InP strained single quantum wells and strained superlattices (SLS) grown by atomic layer epitaxy (ALE). The growth of InAs on InP is strongly influenced by the large lattice mismatch (3.22%). High resolution X-ray diffraction (HRXRD) was carried out. HRXRD can be used to quickly and precisely evaluate the ALE self-limiting growth rate of both InP and InAs. Using interference of X-ray wave fields in a ALE grown InP with an InAs marker layer the authors have accurately determined the growth per cycle. Raman spectra of AL grown InAs/InP SLSs show clearly the longitudinal acoustical folded modes and the longitudinal optic confined modes for both InAs and InP layers. The results indicate that despite the 3.2% lattice mismatch, ALE is a powerful method for fabricating highly strained InAs/InP structures with atomically controlled heterointerfaces
  • Keywords
    III-V semiconductors; Raman spectra; X-ray diffraction; atomic layer epitaxial growth; indium compounds; interface phonons; phonons; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum wells; semiconductor superlattices; InAs-InP; InP; Raman spectra; X-ray diffraction; atomic layer epitaxy; lattice mismatch; longitudinal acoustical folded modes; longitudinal optic confined modes; quantum wells; self-limiting growth rate; strained superlattices; Atom optics; Atomic layer deposition; Epitaxial growth; Indium phosphide; Interference; Laser sintering; Lattices; Optical superlattices; Strain control; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-0993-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1993.380697
  • Filename
    380697