DocumentCode
2500186
Title
Atomic layer epitaxy of InP and InAs/InP heterostructures
Author
Tran, C.A. ; Masu, R.A. ; Brebner, J.L. ; Jouanne, M. ; Leonelli, R.
Author_Institution
Dept. de Phys., Montrel Univ., Que., Canada
fYear
1993
fDate
19-22 Apr 1993
Firstpage
111
Lastpage
114
Abstract
The samples used for this study were InAs/InP strained single quantum wells and strained superlattices (SLS) grown by atomic layer epitaxy (ALE). The growth of InAs on InP is strongly influenced by the large lattice mismatch (3.22%). High resolution X-ray diffraction (HRXRD) was carried out. HRXRD can be used to quickly and precisely evaluate the ALE self-limiting growth rate of both InP and InAs. Using interference of X-ray wave fields in a ALE grown InP with an InAs marker layer the authors have accurately determined the growth per cycle. Raman spectra of AL grown InAs/InP SLSs show clearly the longitudinal acoustical folded modes and the longitudinal optic confined modes for both InAs and InP layers. The results indicate that despite the 3.2% lattice mismatch, ALE is a powerful method for fabricating highly strained InAs/InP structures with atomically controlled heterointerfaces
Keywords
III-V semiconductors; Raman spectra; X-ray diffraction; atomic layer epitaxial growth; indium compounds; interface phonons; phonons; semiconductor epitaxial layers; semiconductor growth; semiconductor quantum wells; semiconductor superlattices; InAs-InP; InP; Raman spectra; X-ray diffraction; atomic layer epitaxy; lattice mismatch; longitudinal acoustical folded modes; longitudinal optic confined modes; quantum wells; self-limiting growth rate; strained superlattices; Atom optics; Atomic layer deposition; Epitaxial growth; Indium phosphide; Interference; Laser sintering; Lattices; Optical superlattices; Strain control; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location
Paris
Print_ISBN
0-7803-0993-6
Type
conf
DOI
10.1109/ICIPRM.1993.380697
Filename
380697
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