DocumentCode
2500287
Title
A single ended low Noise Rail to Rail CMOS Preamplifier
Author
Trampitsch, G.
Author_Institution
CERN, Geneva
Volume
1
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
219
Lastpage
222
Abstract
The CMOS scaling process that is mainly driven by the need to improve digital performance poses critical problems in terms of dynamic range to analog design. Conventional preamplifier-architectures that are considered as optimum design practice have proven useful for many decades. To overcome some of the new constraints a variety of components is available. This increases the number of necessary masks and therefore the cost of circuit fabrication. In order to cope with the constraints of today´s low supply voltages a rail to rail charge sensitive preamplifier designed in a 0.13 mum process is presented. A comparison is made of the proposed design with conventional architectures. Design parameters like output swing ability, gain, bandwidth, power consumption and noise performance are investigated. Finally, experimental results from a prototype submission are presented.
Keywords
CMOS integrated circuits; nuclear electronics; preamplifiers; readout electronics; semiconductor device noise; 0.13 micron; CMOS preamplifier; bandwidth; dynamic range; gain; noise performance; output swing ability; power consumption; rail to rail charge sensitive preamplifier; Bandwidth; CMOS process; Circuits; Costs; Dynamic range; Energy consumption; Fabrication; Low voltage; Performance gain; Preamplifiers;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.356143
Filename
4178982
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