DocumentCode :
2500287
Title :
A single ended low Noise Rail to Rail CMOS Preamplifier
Author :
Trampitsch, G.
Author_Institution :
CERN, Geneva
Volume :
1
fYear :
2006
fDate :
Oct. 29 2006-Nov. 1 2006
Firstpage :
219
Lastpage :
222
Abstract :
The CMOS scaling process that is mainly driven by the need to improve digital performance poses critical problems in terms of dynamic range to analog design. Conventional preamplifier-architectures that are considered as optimum design practice have proven useful for many decades. To overcome some of the new constraints a variety of components is available. This increases the number of necessary masks and therefore the cost of circuit fabrication. In order to cope with the constraints of today´s low supply voltages a rail to rail charge sensitive preamplifier designed in a 0.13 mum process is presented. A comparison is made of the proposed design with conventional architectures. Design parameters like output swing ability, gain, bandwidth, power consumption and noise performance are investigated. Finally, experimental results from a prototype submission are presented.
Keywords :
CMOS integrated circuits; nuclear electronics; preamplifiers; readout electronics; semiconductor device noise; 0.13 micron; CMOS preamplifier; bandwidth; dynamic range; gain; noise performance; output swing ability; power consumption; rail to rail charge sensitive preamplifier; Bandwidth; CMOS process; Circuits; Costs; Dynamic range; Energy consumption; Fabrication; Low voltage; Performance gain; Preamplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
ISSN :
1095-7863
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
Type :
conf
DOI :
10.1109/NSSMIC.2006.356143
Filename :
4178982
Link To Document :
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