• DocumentCode
    2500287
  • Title

    A single ended low Noise Rail to Rail CMOS Preamplifier

  • Author

    Trampitsch, G.

  • Author_Institution
    CERN, Geneva
  • Volume
    1
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    219
  • Lastpage
    222
  • Abstract
    The CMOS scaling process that is mainly driven by the need to improve digital performance poses critical problems in terms of dynamic range to analog design. Conventional preamplifier-architectures that are considered as optimum design practice have proven useful for many decades. To overcome some of the new constraints a variety of components is available. This increases the number of necessary masks and therefore the cost of circuit fabrication. In order to cope with the constraints of today´s low supply voltages a rail to rail charge sensitive preamplifier designed in a 0.13 mum process is presented. A comparison is made of the proposed design with conventional architectures. Design parameters like output swing ability, gain, bandwidth, power consumption and noise performance are investigated. Finally, experimental results from a prototype submission are presented.
  • Keywords
    CMOS integrated circuits; nuclear electronics; preamplifiers; readout electronics; semiconductor device noise; 0.13 micron; CMOS preamplifier; bandwidth; dynamic range; gain; noise performance; output swing ability; power consumption; rail to rail charge sensitive preamplifier; Bandwidth; CMOS process; Circuits; Costs; Dynamic range; Energy consumption; Fabrication; Low voltage; Performance gain; Preamplifiers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.356143
  • Filename
    4178982