Title :
Signal de-noising using adaptive Bayesian wavelet shrinkage
Author :
Chipman, Hugh A. ; Kolacxyk, E.D. ; McCulloch, Robert E.
Author_Institution :
Graduate Sch. of Bus., Chicago Univ., IL, USA
Abstract :
Shrinkage of the empirical wavelet coefficients is an effective way to de-noise signals possessing sparse wavelet transforms. This article outlines a Bayesian approach to wavelet shrinkage, in which the form of the shrinkage function is induced by a particular choice of prior distributions placed on the wavelet coefficients. Our priors are chosen to be mixtures of two normal distributions, one wide and the other narrow, so as to effectively model the sparseness inherent in the wavelet representations of many signals. This particular choice of prior also allows us to obtain a closed-form expression for the shrinkage function (posterior mean) and for the corresponding uncertainty (posterior variance). This uncertainty information is used in turn to generate uncertainty bands for the full signal reconstruction. An automatic, level-dependent scheme is used to adapt the shrinkage functions to each resolution level of coefficients, although subjective information may be incorporated quite easily
Keywords :
Bayes methods; adaptive signal processing; noise; normal distribution; signal reconstruction; signal representation; signal resolution; wavelet transforms; adaptive Bayesian wavelet shrinkage; automatic level-dependent scheme; closed-form expression; empirical wavelet coefficients; normal distributions; posterior mean; posterior variance; prior distributions; resolution; signal de-noising; signal reconstruction; sparse wavelet transforms; uncertainty bands; wavelet representations; Bayesian methods; Closed-form solution; Gaussian distribution; Signal denoising; Signal generators; Signal reconstruction; Signal resolution; Uncertainty; Wavelet coefficients; Wavelet transforms;
Conference_Titel :
Time-Frequency and Time-Scale Analysis, 1996., Proceedings of the IEEE-SP International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-7803-3512-0
DOI :
10.1109/TFSA.1996.547454