Local area characterization of organic ultra-thin films by scanning tunneling spectroscopy

Author

Kuniyoshi, S. ; Aoki, K. ; Iizuka, M. ; Kudo, K. ; Tanaka, K.

Author_Institution

Dept. of Electron. & Mech. Eng., Chiba Univ., Japan

fYear

1998

fDate

27-30 Sep 1998

Firstpage

531

Lastpage

534

Abstract

In this study, we measured the scanning tunneling spectroscopy (STS) of copper phthalocyanine (CuPc) thin films deposited on substrates or STM tips of silicon (p- and n⁺-Si) and metal (Pt-Ir, Al). The STS measurements using semiconductor tip and organic film coated tip are powerful to investigate the surface and interface analysis of organic thin films. The results obtained here explain the asymmetry of the STS characteristics and provide important information such as band gap and local density of states of organic thin films. These basic characterization using STS will help to clear understanding with molecular level and future device applications

Keywords

electronic density of states; energy gap; organic semiconductors; scanning tunnelling spectroscopy; semiconductor thin films; band gap; copper phthalocyanine; interface analysis; local density of states; organic ultra-thin film; scanning tunneling spectroscopy; surface analysis; Copper; Photonic band gap; Semiconductor films; Semiconductor thin films; Silicon; Sociotechnical systems; Spectroscopy; Sputtering; Substrates; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on

Conference_Location

Toyohashi

Print_ISBN

4-88686-050-8

Type

conf

DOI

10.1109/ISEIM.1998.741798

Filename

741798