Title :
Growth and Characterisation of High Purity Quartz
Author :
Croxall, D.F. ; Christie, I.A. ; Halt, J.M. ; Isherwood, B.J. ; Todd, A.G.
Keywords :
Contamination; Crystals; Frequency; Gold; Impurities; Piezoelectric devices; Piezoelectric materials; Silicon compounds; Surface topography; Temperature;
Conference_Titel :
36th Annual Symposium on Frequency Control. 1982
Conference_Location :
Philadelphia, Pennsylvania, USA
DOI :
10.1109/FREQ.1982.200553
