Title :
Inverse scattering problem in diagnostics of multilayer periodic structures
Author :
Gaikovich, K.P. ; Gaikovich, P.K. ; Sumin, M.I.
Author_Institution :
Inst. for Phys. of Microstructures, Nizhny Novgorod, Russia
Abstract :
The dual regularization method is applied in the inverse problem of electromagnetic scattering to retrieve permittivity inhomogeneities in multilayer periodic dielectric structures. Based on the developed theory, the solution algorithm has been worked out and applied in the numerical simulation of the multifrequency reflectometry diagnostics of inhomogeneities in multilayer structures of X-ray optics.
Keywords :
X-ray optics; electromagnetic wave scattering; permittivity; X-ray optics; dual regularization method; inverse electromagnetic scattering problem; multifrequency reflectometry diagnostics; multilayer periodic structures; numerical simulation; permittivity inhomogeneities; Inverse problems; Nonhomogeneous media; Numerical simulation; Periodic structures; Permittivity; Reflectometry; Scattering; Dual regularization; electromagnetic sounding; inverse scattering problem; multilayered periodic structures; permittivity profile;
Conference_Titel :
Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), 2012 6th International Conference on
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4673-1940-9
DOI :
10.1109/UWBUSIS.2012.6379788
