• DocumentCode
    2500722
  • Title

    Thermal Analysis of AT & SC-Cut Quartz Crystal Resonators Automated Measurement Method and Results

  • Author

    Förster, Hans-Joschim

  • fYear
    1982
  • fDate
    2-4 June 1982
  • Firstpage
    140
  • Lastpage
    158
  • Keywords
    CMOS technology; Capacitance; Circuits; Frequency measurement; Hysteresis; Measurement standards; Oscillators; System testing; Temperature; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    36th Annual Symposium on Frequency Control. 1982
  • Conference_Location
    Philadelphia, Pennsylvania, USA
  • Type

    conf

  • DOI
    10.1109/FREQ.1982.200563
  • Filename
    1537503
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2500722