Title :
An improved method for determining normalized site attenuation using log periodic dipole arrays
Author :
Chen, Zhong ; Foegelle, Michael
Author_Institution :
EMC Test Syst., Austin, TX, USA
Abstract :
A normalized site attenuation (NSA) measurement, made using LPDA free-space antenna factors (AF) as specified in ANSI C63.4, has up to 3 dB of systematic errors due to limitations in the current theory. The ANSI model fails to account for the log periodic antenna´s radiation pattern and its active phase center position, which were shown to be the dominant effects causing these errors. An enhanced theoretical model is introduced in this paper to take these two effects into account. In the enhanced model, antenna radiation patterns and active phase center positions are assumed to be unknown. At each frequency, the unknowns are solved by fitting the theoretical magnitude or phase response to a measured antenna response taken at different heights. The complex fit NSA (CFNSA) is then obtained by including the varied phase center and radiation pattern of the antennas under test. It is shown that the CFNSA model reduces the systematic errors in the current NSA to less than a dB
Keywords :
ANSI standards; antenna radiation patterns; dipole antenna arrays; electromagnetic wave absorption; log periodic antennas; measurement errors; measurement standards; ANSI C63.4; ANSI model; CFNSA model; LPDA free-space antenna factors; NSA measurement; active phase center position; active phase center positions; antenna heights; antenna radiation pattern; antennas under test; complex fit NSA; enhanced theoretical model; log periodic dipole arrays; measured antenna response; normalized site attenuation measurement; systematic errors; theoretical magnitude response; theoretical phase response; Antenna measurements; Antenna radiation patterns; Antenna theory; Attenuation measurement; Current measurement; Dipole antennas; Frequency; Log periodic antennas; Phase measurement; Receiving antennas;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.874673