• DocumentCode
    2501460
  • Title

    Assessing the effects of an OATS shelter: is ANSI C63.7 enough?

  • Author

    Johnk, Robert T. ; Novotny, David R. ; Weil, Claude M. ; Medley, Herbert W.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    523
  • Abstract
    This paper summarizes a previous measurement effort by NIST researchers at an open-area test site (OATS), operated by a large information technology equipment manufacturer. The purpose of this effort was to assess the effects on emissions measurements of a fiberglass dielectric shelter that is used to protect and temperature stabilize information technology equipment undergoing emissions tests. NIST researchers and industry are seeking to answer questions about the impact of OATS shelters using an ultra wideband time-domain measurement system. This paper summarizes the instrumentation used, the measurement methodologies, and the data obtained. The results indicate that the fiberglass shelter can have a significant impact at frequencies above 100 MHz, a result which should be of interest to the emissions testing community
  • Keywords
    dielectric materials; electromagnetic interference; electronic equipment testing; glass fibre reinforced composites; measurement standards; test facilities; ANSI C63.7 standard; EMI; NIST; OATS shelter; OATS shelters; emissions measurements; emissions tests; fiberglass dielectric shelter; information technology equipment manufacturer; information technology equipment protection; instrumentation; measurement data; measurement methodologies; open-area test site; ultra wideband time-domain measurement system; Dielectric measurements; Information technology; Manufacturing industries; NIST; Open area test sites; Optical fiber devices; Optical fiber testing; Protection; Pulp manufacturing; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2000. IEEE International Symposium on
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-5677-2
  • Type

    conf

  • DOI
    10.1109/ISEMC.2000.874675
  • Filename
    874675