Title :
Effects of Gamma Irradiation on Silicon Carbide Semiconductor Radiation Detectors
Author :
Ruddy, Frank H. ; Siedel, John G.
Author_Institution :
Dept. of Sci. & Technol., Westinghouse Electr. Co., Pittsburgh, PA
fDate :
Oct. 29 2006-Nov. 1 2006
Abstract :
Silicon carbide (SiC) semiconductor radiation detectors are being developed for alpha-particle, X- and gamma-ray, and fast-neutron energy spectrometry. SiC detectors have been operated at temperatures up to 306degC and have also been found to be highly resistant to the radiation effects of fast-neutron and charged-particle bombardments. In the present work, the alpha-particle response of a SiC detector based on a Schottky diode design has been monitored as a function of 137Cs gamma-ray exposure. The changes in response have been found to be negligible for gamma-ray exposures up to and including 22.7 MGy, and irradiations to higher doses are in progress. Results will be reported for alpha and fast-neutron response testing following cumulative doses up to 22.7 MGy.
Keywords :
Schottky diodes; gamma-ray effects; silicon compounds; silicon radiation detectors; 137Cs gamma ray exposure; Schottky diode design; X-ray spectrometry; alpha particle response testing; alpha particle spectrometry; fast neutron energy spectrometry; fast neutron response testing; gamma irradiation effects; gamma ray spectrometry; silicon carbide semiconductor radiation detectors; Gamma ray detection; Gamma ray detectors; Monitoring; Radiation detectors; Radiation effects; Schottky diodes; Semiconductor radiation detectors; Silicon carbide; Spectroscopy; Temperature;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-0560-2
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2006.356223