DocumentCode :
2501818
Title :
Development of the complexity measure for assembly line systems using entropy concept
Author :
He, Fei ; Rao, Yunqing ; Zhang, Chaoyong ; Shao, Xinyu
Author_Institution :
State Key Lab. of Digital Manuf. Equip. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan
fYear :
2008
fDate :
25-27 June 2008
Firstpage :
9037
Lastpage :
9042
Abstract :
This paper aims at understanding the complexity of the assembly line systems, and the entropy is introduced to modeling the assembly line system. In order to describe the assembly line more exactly, three kinds of complexity are classified and measured, which is structure complexity, process complexity and operation complexity. The structure complexity is used to measure the level of complexity about the assembly line itself, the process complexity can measure the complexity when the assembly line produce only one product, and the operation complexity can describe the complexity when the assembly line produces a batch of products under given scheduling rule. The operation complexity and process complexity are both decomposed into static and dynamic complexity. Finally two kinds of effectiveness of schedule are measured and applied to forecast the number of buffers between two assembly lines when the effectiveness of schedule is under given value.
Keywords :
assembling; batch processing (industrial); entropy; scheduling; assembly line systems; entropy concept; operation complexity; process complexity; scheduling rule; structure complexity; Assembly systems; Chaos; Entropy; Helium; Information theory; Intelligent control; Job shop scheduling; Manufacturing automation; Manufacturing systems; Paper technology; Assembly Line; Complexity; Effectiveness of schedule; Entropy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-2113-8
Electronic_ISBN :
978-1-4244-2114-5
Type :
conf
DOI :
10.1109/WCICA.2008.4594358
Filename :
4594358
Link To Document :
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