Title :
Defects and reliability analysis of large software systems: field experience
Author_Institution :
AT&T Bell Lab., Naperville, IL, USA
Abstract :
The contribution of software to the reliability of large distributed systems is addressed. The author analyzes and models the software development process and presents field experience for these large distributed systems. Defect removal is shown to be the bottleneck in achieving the appropriate quality level before system deployment in the field. The author presents a model that relates generic field introduction to the residual defect level and allows reliability prediction since system reliability is related to the residual defect level.<>
Keywords :
fault tolerant computing; software reliability; defects; generic field introduction; large distributed systems; large software systems; reliability analysis; residual defect level; software development process; Availability; Communication industry; Computer aided manufacturing; Distributed computing; Military computing; Programming; Reliability; Software systems; Switches; Telecommunication computing;
Conference_Titel :
Fault-Tolerant Computing, 1989. FTCS-19. Digest of Papers., Nineteenth International Symposium on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-8186-1959-7
DOI :
10.1109/FTCS.1989.105573
