DocumentCode
2501928
Title
Spike detection in the preterm fetal sheep EEG using Haar wavelet analysis
Author
Walbran, Anita C. ; Unsworth, Charles P. ; Gunn, Alistair J. ; Bennet, Laura
Author_Institution
Dept. of Eng. Sci., Univ. of Auckland, Auckland, New Zealand
fYear
2011
fDate
Aug. 30 2011-Sept. 3 2011
Firstpage
7063
Lastpage
7066
Abstract
Perinatal hypoxia is a significant cause of brain injury in preterm infants. Neuroprotective treatments have proven beneficial when commenced within 6-8 hours post hypoxic-ischemic insult. However, as the exact time of injury is unknown, there are no current means to determine which infants are in the treatment phase of the evolving injury. Recent studies suggest epileptiform transients in the first 6-8 hours are predictive of outcome. To quantify this further an automated means of transient identification is required. In this paper we describe a method using Haar wavelets to detect spikes in the preterm fetal sheep EEG after asphyxia in utero. The method exhibits good sensitivity and selectivity over 3 specific time periods and demonstrates the feasibility of using wavelets for spike detection in fetal sheep.
Keywords
Haar transforms; electroencephalography; injuries; medical signal detection; medical signal processing; neurophysiology; obstetrics; wavelet transforms; EEG; Haar wavelet analysis; asphyxia in utero; brain injury; epileptiform transients; hypoxic-ischemic insult; neuroprotective treatments; perinatal hypoxia; preterm fetal sheep; preterm infants; spike detection; time 6 h to 8 h; Blood; Educational institutions; Electroencephalography; Sensitivity; Transient analysis; Wavelet analysis; Wavelet transforms; Algorithms; Animals; Asphyxia; Blood Gas Analysis; Cluster Analysis; Electroencephalography; Fetal Monitoring; Models, Statistical; Reproducibility of Results; Sensitivity and Specificity; Sheep; Signal Processing, Computer-Assisted; Time Factors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location
Boston, MA
ISSN
1557-170X
Print_ISBN
978-1-4244-4121-1
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2011.6091785
Filename
6091785
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