Title :
Cramér-Rao bounds on the performance of simulated annealing and genetic algorithms in EEG source localization
Author :
Escalona-Vargas, D.I. ; Gutiérrez, D. ; Lopez-Arevalo, I.
Author_Institution :
Center of Res. & Adv. Studies (Cinvestav) at Tamauli-pas, Ciudad Victoria, Mexico
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
In this paper, we evaluate the performance of simulated annealing (SA) and the genetic algorithm (GA) when used for electroencephalographic (EEG) source localization. The performance is evaluated on the variance of the estimated localizations as a function of the optimization´s initialization parameters and the signal-to-noise ratio (SNR). We use the concentrated likelihood function (CLF) as objective function and the Cramér-Rao bound (CRB) as a reference on the performance. The CRB sets the lower limit on the variance of our estimated values. Then, our simulations on realistic EEG data show that both SA and GA are highly sensitive to noise, but adjustments on their parameters for a fixed SNR value do not improve performance significantly. Our results also confirm that SA is more sensitive to noise and its performance may be affected by correlated sources.
Keywords :
electroencephalography; genetic algorithms; simulated annealing; CRB; Cramer-Rao bound; EEG data; EEG source localization; concentrated likelihood function; electroencephalographic source localization; genetic algorithm; optimization initialization parameters; signal-to-noise ratio; simulated annealing; Biological cells; Electroencephalography; Estimation; Genetic algorithms; Signal to noise ratio; Simulated annealing; Algorithms; Brain; Crossing Over, Genetic; Electroencephalography; Humans; Likelihood Functions; Models, Genetic; Models, Statistical; Normal Distribution; Reproducibility of Results; Signal Processing, Computer-Assisted; Signal-To-Noise Ratio; Stochastic Processes; Temperature;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091798