• DocumentCode
    2502270
  • Title

    Development of Tracking Detectors with industrially produced GEM Foils

  • Author

    Simon, F. ; Azmoun, B. ; Burns, L. ; Crary, D. ; Kearney, K. ; Keeler, G. ; Majka, R. ; Paton, K. ; Smirnov, N. ; Surrow, B. ; Woody, C.

  • Author_Institution
    Lab. for Nucl. Sci., Massachusetts Inst. of Technol., Cambridge, MA
  • Volume
    2
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    660
  • Lastpage
    664
  • Abstract
    The planned tracking upgrade of the STAR experiment at RHIC includes a large-area GEM tracker used to determine the charge sign of electrons and positrons produced from W+(-) decays. For such a large-scale project commercial availability of GEM foils is necessary. We report first results obtained with a triple GEM detector using GEM foils produced by Tech-Etch Inc. of Plymouth, MA, USA. Measurements of gain uniformity, long-term stability as well as measurements of the energy resolution for X-rays are compared to results obtained with an identical detector using GEM foils produced at CERN. A quality assurance procedure based on optical tests using an automated high-resolution scanner has been established, allowing a study of the correlation of the observed behavior of the detector and the geometrical properties of the GEM foils. Detectors based on Tech-Etch and CERN produced foils both show good uniformity of the gain over the active area and stable gain after an initial charge-up period, making them well suited for precision tracking applications.
  • Keywords
    electron multiplier detectors; energy loss of particles; tungsten; GEM foils; GEM tracker; RHIC; STAR experiment; Tech-Etch Inc.; W+(-) decay; electron charge sign; positron charge sign; tracking detectors; tracking upgrade; Electrons; Energy measurement; Energy resolution; Gain measurement; Large-scale systems; Positrons; Quality assurance; Stability; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.355944
  • Filename
    4179098