Title :
Fault detection in CVS parity trees: application in SSC CVS parity and two-rail checkers
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Abstract :
The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. CVS circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. If the CVS parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then it is shown that at most only five tests are needed for detecting all single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, than the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate. For such a tree it is shown that only eight tests are enough. For a strongly self-checking (SSC) CVS parity checker the number of required tests is nine, whereas for an SSC CVS two-rail checker the size of the test set is at most five.<>
Keywords :
CMOS integrated circuits; error detection; failure analysis; fault tolerant computing; integrated logic circuits; logic gates; logic testing; EX-OR gates; differential cascode voltage switch; dynamic CMOS circuits; fault detection; noninverting functions; parity checker; parity trees; primary inputs; single-ended cascode voltage switch; strongly self checking property; stuck-at faults; stuck-on fault; stuck-open faults; test set size; two-rail checkers; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; MOS devices; Robustness; Switches; Voltage;
Conference_Titel :
Fault-Tolerant Computing, 1989. FTCS-19. Digest of Papers., Nineteenth International Symposium on
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-8186-1959-7
DOI :
10.1109/FTCS.1989.105603
