Test generator with preselected toggling for low power built-in self-test

Author

Rajski, Janusz ; Tyszer, Jerzy ; Mrugalski, Grzegorz ; Nadeau-Dostie, Benoit

Author_Institution

Mentor Graphics Corp., Wilsonville, OR, USA

fYear

2012

fDate

23-25 April 2012

Firstpage

1

Lastpage

6

Abstract

This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this device to produce binary sequences with low toggling (switching) rates while preserving test coverage achievable by the best-to-date conventional BIST-based PRPGs with negligible impact on test application time.

Keywords

binary sequences; built-in self test; low-power electronics; phase shifters; random number generation; PRESTO activity; best-to-date conventional BIST; binary sequences; linear feedback shift register; linear finite state machine; low toggling rates; phase shifter; preselected toggling activity; pseudorandom test pattern generator; ring generator; test application time; Built-in self-test; Circuit faults; Generators; Latches; Logic gates; Shift registers; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium (VTS), 2012 IEEE 30th

Conference_Location

Hyatt Maui, HI

ISSN

1093-0167

Print_ISBN

978-1-4673-1073-4

Type

conf

DOI

10.1109/VTS.2012.6231071

Filename

6231071