DocumentCode :
2502877
Title :
An Analysis of Thickness-Extensional Trapped Energy Resonators with Rectangular Electrodes in the Zinc-Oxide Thin Film on Silicon Configuration
Author :
Tiersten, H.F. ; Stevens, D.S.
fYear :
1983
fDate :
1-3 June 1983
Firstpage :
325
Lastpage :
336
Keywords :
Differential equations; Dispersion; Electrodes; Etching; Performance analysis; Piezoelectric films; Resonance; Resonant frequency; Semiconductor thin films; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
37th Annual Symposium on Frequency Control. 1983
Conference_Location :
Philadelphia, Pennsylvania, USA
Type :
conf
DOI :
10.1109/FREQ.1983.200688
Filename :
1537628
Link To Document :
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