DocumentCode :
2503058
Title :
Low-cost high-speed pseudo-random bit sequence characterization using nonuniform periodic sampling in the presence of noise
Author :
Moon, Thomas ; Tzou, Nicholas ; Wang, Xian ; Choi, Hyun ; Chatterjee, Abhijit
Author_Institution :
Sch. of ECE, Georgia Tech, Atlanta, GA, USA
fYear :
2012
fDate :
23-25 April 2012
Firstpage :
146
Lastpage :
151
Abstract :
In this paper, we propose a wideband signal reconstruction scheme for testing high-speed pseudo random bit sequences (PRBSs) in the presence of jitter noise using incoherent sampling. The proposed approach exploits synchronous multirate sampling (SMRS) hardware and multicoset back-end signal processing algorithms. The SMRS hardware consists of multiple analog-to-digital converters (ADCs) whose sampling frequencies are synchronized with a common frequency reference and can be individually configured. The optimal sampling frequency of each ADC is chosen based on the input signal information and sampling hardware specifications. As compared to other sampling hardware used for multicoset signal reconstruction, the proposed approach uses less number of ADCs and does not require accurate sampling clock phase adjustment. In the digital signal reconstruction, the input waveform is reconstructed by the multicoset signal processing algorithms and the phase noise of each tone of the PRBS test signal is measured.
Keywords :
analogue-digital conversion; jitter; logic testing; phase noise; random sequences; signal reconstruction; signal sampling; PRBS test signal; SMRS hardware; analog-to-digital converters; common frequency reference; digital signal reconstruction; incoherent sampling; input signal information; input waveform; jitter noise; low-cost high-speed pseudo-random bit sequence characterization; multicoset back-end signal processing algorithms; multicoset signal reconstruction; nonuniform periodic sampling; optimal sampling frequency; phase noise; sampling clock phase adjustment; sampling frequencies; sampling hardware specifications; synchronous multirate sampling hardware; wideband signal reconstruction scheme; Educational institutions; Frequency estimation; Jitter; Noise; Analog-to-digital converters; Nonuniform periodic sampling; PRBS; jitter noise; phase noise; signal representation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Hyatt Maui, HI
ISSN :
1093-0167
Print_ISBN :
978-1-4673-1073-4
Type :
conf
DOI :
10.1109/VTS.2012.6231094
Filename :
6231094
Link To Document :
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