• DocumentCode
    2503144
  • Title

    Static test compaction for transition faults under the hazard-based detection conditions

  • Author

    Pomeranz, Irith

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2012
  • fDate
    23-25 April 2012
  • Firstpage
    176
  • Lastpage
    181
  • Abstract
    The conventional detection conditions for transition faults require a transition at the fault site for activating a fault. The hazard-based detection conditions allow a transition fault to be activated by a pulse. Earlier, the hazard-based detection conditions were used for obtaining more accurate estimates of transition fault coverage and for more accurate defect diagnosis. This paper considers their use for test compaction. The procedure described in this paper replaces the conventional detection conditions with the hazard-based detection conditions for some faults. The use of the hazard-based detection conditions allows each test to detect more faults, thus allowing the number of tests to be reduced.
  • Keywords
    fault diagnosis; logic testing; defect diagnosis; hazard-based detection conditions; static test compaction; transition fault coverage; transition faults; Benchmark testing; Circuit faults; Compaction; Educational institutions; Fault detection; Hazards; Vectors; Broadside tests; hazards; skewed-load tests; static test compaction; transition faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2012 IEEE 30th
  • Conference_Location
    Hyatt Maui, HI
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-1073-4
  • Type

    conf

  • DOI
    10.1109/VTS.2012.6231099
  • Filename
    6231099