DocumentCode :
2503269
Title :
Development of evaluation environment for physical attacks against embedded devices
Author :
Katashita, Toshihiro ; Sasaki, Akihiko ; Hori, Yohei ; Shiozaki, Mitsuru ; Fujino, Takeshi
Author_Institution :
Res. Inst. of Secure Syst., Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear :
2012
fDate :
2-5 Oct. 2012
Firstpage :
593
Lastpage :
596
Abstract :
Physical attacks against cryptographic modules on embedded systems are different with theoretical analysis. Side-channel attacks, which are noninvasive physical attacks, exploit the measurable parameters of devices. In this study, we have developed a cryptographic LSI environment for testing side-channel attacks. The environment is designed such that small fluctuations in LSI power consumption can be measured. A printed circuit board, and control hardware and software are developed, and are available on our website to provide a uniform environment for side-channel testing of LSIs. Details of the developed environment are described in this paper, and its performance in measurements and tests is demonstrated through an experiment that replicates a side-channel attack.
Keywords :
cryptography; embedded systems; field programmable gate arrays; large scale integration; printed circuits; LSI power consumption; control hardware; cryptographic LSI environment; cryptographic modules; embedded devices; embedded systems; evaluation environment; physical attacks; printed circuit board; side channel attacks; side channel testing; Correlation; Cryptography; Large scale integration; Performance evaluation; Power demand; Power measurement; Standards; FPGA; Physical attacks; embedded devices; evaluation environment; side-channel attacks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Consumer Electronics (GCCE), 2012 IEEE 1st Global Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4673-1500-5
Type :
conf
DOI :
10.1109/GCCE.2012.6379924
Filename :
6379924
Link To Document :
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