• DocumentCode
    2503377
  • Title

    Foreword

  • Author

    Metra, Cecilia ; Thibeault, Claude

  • Author_Institution
    University of Bologna, Italy
  • fYear
    2012
  • fDate
    23-25 April 2012
  • Abstract
    Welcome to VTS 2012, the thirtieth in a series of annual symposia that focus on innovation in the field of testing of integrated circuits and systems.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2012 IEEE 30th
  • Conference_Location
    Maui, HI, USA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-1073-4
  • Type

    conf

  • DOI
    10.1109/VTS.2012.6231110
  • Filename
    6231110
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2503377