Title :
[Front and back cover]
Abstract :
The following topics are dealt with: BIST; analog integrated circuits, mixed-signal integrated circuits; radiofrequency integrated circuits; chip autopsies; online test; delay; 3D integrated circuits; integrated circuit reliability; integrated circuit variability; design for testing; ATPG; debugging; memory testing; design verification; power supply noise; SRAM; and current testing.
Keywords :
SRAM chips; analogue integrated circuits; automatic test pattern generation; built-in self test; delay circuits; integrated circuit reliability; integrated circuit testing; mixed analogue-digital integrated circuits; three-dimensional integrated circuits; 3D integrated circuits; ATPG; BIST; SRAM; analog integrated circuits; chip autopsies; current testing; debugging; delay; design for testing; design verification; integrated circuit reliability; integrated circuit variability; memory testing; mixed signal integrated circuits; online test; power supply noise; radiofrequency integrated circuits;
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Hyatt Maui, HI
Print_ISBN :
978-1-4673-1073-4
DOI :
10.1109/VTS.2012.6231111
