• DocumentCode
    2503425
  • Title

    TTTC: Test Technology Technical Council

  • fYear
    2012
  • fDate
    23-25 April 2012
  • Abstract
    This work describes the purpose, activities and lists membership of the IEEE Computer Society TTTC: Test Technology Technical Council.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2012 IEEE 30th
  • Conference_Location
    Maui, HI, USA
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-1073-4
  • Type

    conf

  • DOI
    10.1109/VTS.2012.6231113
  • Filename
    6231113
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2503425