مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2503441

Title :

[Sponsors]

fYear :

2012

fDate :

23-25 April 2012

Firstpage :

Lastpage :

Abstract :

The VLSI Test Symposium is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium (VTS), 2012 IEEE 30th

Conference_Location :

Maui, HI, USA

ISSN :

1093-0167

Print_ISBN :

978-1-4673-1073-4

Type :

conf

DOI :

10.1109/VTS.2012.6231114

Filename :

6231114

Link To Document :