• DocumentCode
    2503479
  • Title

    Tutorial 1

  • Author

    Karri, Ramesh ; Song, Peilin ; Sinanoglu, Ozgur

  • Author_Institution
    NYU-Poly, New York, NY, USA
  • fYear
    2012
  • fDate
    23-25 April 2012
  • Abstract
    This tutorial is most suitable for DFT and Test Engineers, Validation and Verification engineers, Researchers and students in DFT, testing and validation, hardware security.
  • Keywords
    VLSI; design for testability; integrated circuit testing; security; DFT; VLSI security; VLSI test; hardware security; test engineers; validation engineers; verification engineers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium (VTS), 2012 IEEE 30th
  • Conference_Location
    Hyatt Maui, HI
  • ISSN
    1093-0167
  • Print_ISBN
    978-1-4673-1073-4
  • Type

    conf

  • DOI
    10.1109/VTS.2012.6231117
  • Filename
    6231117